ZEISS’ 100 years – Connecting to Productivity

ZEISS’ 100 years – Connecting to Productivity

October 7, 2019

Zeiss Industrial Quality Solutions

https://www.zeiss.com/us

At this years’ Quality Show, ZEISS Industrial Quality Solutions looks back at 100 years of company history while focusing on the theme, Connect to Productivity. Visitors to booth #1108 will be able to experience the broad ZEISS portfolio, from surface measurement systems and microscopy to optical machines to CT systems. The ZEISS learning theater presentation, Technical Learning in the Workplace: The Impact and Benefits of Digitalization, will be held on the exhibit hall floor on Wed., Oct. 23.

Process control and in-line inspection
The latest CT technology from ZEISS, the METROTOM system, allows for measuring and inspecting complete components made of plastic or light metal. Learn about CT systems that can be configured for both manual and automated loading. See the shopfloor ZEISS DuraMax HTG system with integrated robotic loading. This system has a smaller footprint and an even higher operating temperature range from +15ºC to +40ºC.

Optical and optical-contact systems
The new ZEISS T-Scan 20 3D scanning system saves time and increases precision. It offers cutting-edge scanner technology and a larger measuring volume to ensure consistently efficient measuring processes. ZEISS O-Inspect multisensor measuring machines enable you to optimally measure each characteristic – optically or by contact. 2D and 3D characteristics can now be measured on three different sizes with measuring volumes up to 800mm x 600mm x 300mm.

ZEISS Bridge-type CMMs
The new ZEISS Prismo verity CMM has an uncertainty as low as 0.7+L/400 μm. Save additional time by drastically reducing the number of probe changes with the versatile ZEISS Articulating Stylus for the VAST gold sensor. It also frees up space otherwise needed to store other fixed position stylus systems. And the new entry-level Spectrum CMM will also be on display.

Bridging Microscopy and Metrology
ZEISS NEO pixel software enables precise metrology on a microscopic level with ease. Predefined measurement tasks can be performed automatically, with reliable user-independent results. ZEISS NEO is extremely versatile, available on all ZEISS microscopes and allows for report generation with ZEISS PiWeb. ZEISS PiWeb allows for export of data for further analysis, along with the ability to share that data with colleagues in other labs.

Flexible surface and roundness measurement systems
The NEX series of surface and roundness instruments allows both types of measurements to be completed with one system. Surfcom NEX offers a single hybrid detector to measure surface texture and contour at the same time. Rondcom NEX offers best-in-class spindle accuracy and allows optional surface roughness measurements in the horizontal, vertical and radial axes.

Data management
ZEISS PiWeb
software combines measurement data from multiple systems into graphical part stories, SPC charts, quality documents and dashboards. It allows engineering, production and quality managers easy, remote access to all reports at any time.

Most Shared